[FMCp1-2] The Effect of the In2O3 Insertion Layer on HfO2/AlOX-Based Resistive Memory Characteristics
Resistive random-access memory, Resistive switching, HfO2/AlO RRAM, In2O3 insertion layer
We fabricated HfO2/Al2O3-based RRAM structures with an inserted In2O3 layer and investigated the effect of oxygen vacancies by resistive switching measurement. By introducing In2O3 layer, we confirmed the incorporation of oxygen vacancies within the insulating layer of RRAM devices. This indicates that ...