International Display Workshops General Incorporated Association

09:00 〜 09:20

[MEET4-1 (Invited)] Catastrophic Failure in Quantum Dots Light-Emitting Diodes: a Morphology Study

Jingrui Ma1, Xiangwei Qu1, *Xiao Wei Sun1 (1. Southern University of Science and Technology (China))

Quantum dot, Quantum dot light-emitting diode, Electron transport layer, Exciton quenching

https://doi.org/10.36463/idw.2023.0936

Understanding the failure mechanisms of quantum dot light-emitting diodes is crucial for their applications. In this study, morphological analysis of catastrophically failed devices reveals distinctive volcanic-like characteristics. These features stem from the detachment and disruption of the device's structure, encompassing the organic functional layer and metal electrode. This phenomenon is believed to be initiated by the synergistic effects of oxygen, moisture, and electrical current.