[B-7-1] Effective Funneling Length in Alpha-Particle Induced Soft Errors

E. TAKEDA、K. TAKEUCHI、E. YAMASAKI、T. TOYABE、K. OHSHIMA、K. ITOH (1.Central Research Laboratory, Hitachi Ltd.、2.Hitachi VLSI Engineering Corp.、3.Device Development Center, Hitachi Ltd.)

https://doi.org/10.7567/SSDM.1986.B-7-1