Current Oscillation with an InAs/AlSb Resonant-Tunneling Diode Measured at 77K

Kanji Yoh Hisaki Kawahara; Masataka Inoue

doi:https://doi.org/10.7567/SSDM.1994.C-1-2

[C-1-2] Current Oscillation with an InAs/AlSb Resonant-Tunneling Diode Measured at 77K

Kanji Yoh Hisaki Kawahara, Masataka Inoue (1.Research Center for Interface Quntum Electronics, Hokkaido University, 2.Department of Electrical Engineering, Osaka Institute of Technology)

https://doi.org/10.7567/SSDM.1994.C-1-2

1994 International Conference on Solid State Devices and Materials

[C-1-2] Current Oscillation with an InAs/AlSb Resonant-Tunneling Diode Measured at 77K