[C-5-1] Scanning Single Electron Transistor Microscopy: Imaging Individual Charges

M. J. Yoo、T. A. Fulton、H. F. Hess、R. L. Willett、L. N. Dunkleberger、R. J. Chichester、L. N. Pfeiffer、K. W. West (1.Lucent Technologies Bell Laboratories)

https://doi.org/10.7567/SSDM.1998.C-5-1