[A-1-4] A New Observation of the Width Dependent Hot Carrier Effect in Shallow-Trench-Isolated P-MOSFET's

Steve S. Chung、W.-J. Yang、C.-M. Yih、J.-J. Yang (1.Department of Electronic Engineering, National Chiao Tung University、2.Worldwide Semiconductor Manufacturing Co.)

https://doi.org/10.7567/SSDM.1999.A-1-4