[B-6-8] A Strong Temperature-Dependent Hole Direct Tunneling Current in p+-Gate/pMOSFET with Ultra-Thin Gate Oxide

Chew-Hoe Ang、Chung-Ho Ling、Zhi-Yuan Cheng、Byung-Jin Cho (1.Department of Electrical Engineering, National University of Singapore)

https://doi.org/10.7567/SSDM.2000.B-6-8