[D-9-4] A Thermal Resistance Measurement of HBT with Pulsed Current I-V Setup and Its Scalability with the Total Emitter Area

Hyun-Min Park、Sang-Hoon Cheon、Songcheol Hong (1.Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST))

https://doi.org/10.7567/SSDM.2000.D-9-4