[E-6-5] Frequency Dispersion in Drain Conductance of InAlAs/InGaAs HEMTs and Its Correlation with Impact Ionization

Toshihiko Kosugi、Yohtaro Umeda、Tetsuya Suemitsu、Takatomo Enoki、Yasuro Yamane (1.NTT Photonics Laboratories)

https://doi.org/10.7567/SSDM.2000.E-6-5