[E-3-3] Electronic Charged States of Single Si Quantum Dots with Ge Core as Detected by AFM/Kelvin Probe Technique
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード
463件中(191 - 200)
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード
2003 International Conference on Solid State Devices and Materials |PDF ダウンロード