[A-1-4] Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy

K. Suzuki、K. Kanisawa、S. Perraud、M. Ueki、K. Takashina、Y. Hirayama (1.NTT Basic Research Laboratories, NTT Corporation、2.Laboratoire de Photonique et de Nanostructures, CNRS、3.NTT Electronics Techno Corporation、4.SORST-JST、5.Graduate School of Science、6.Tohoku University)

https://doi.org/10.7567/SSDM.2006.A-1-4