[B-7-4] Mitigation of CMOS Variability with Metal Gate

J. W. Yang¹, C. S. Park¹, H. R. Harris¹, C. E. Smith¹, H. Adhikari¹, J. Huang¹, D. Heh¹, P. Majhi¹, R. Jammy¹ (1.SEMATECH, USA)

https://doi.org/10.7567/SSDM.2008.B-7-4