[C-8-2] Effect of Hot-Carrier Stress on the Recoverable and Permanent Components of Negative-Bias Temperature Instability
T. J. J. Ho1, D. S. Ang1, C. M. Ng2
(1.Nanyang Tech. Univ., 2.GLOBALFOUNDRIES Singapore Pte. Ltd. , Singapore)
https://doi.org/10.7567/SSDM.2010.C-8-2
