[C-8-2] Effect of Hot-Carrier Stress on the Recoverable and Permanent Components of Negative-Bias Temperature Instability

T. J. J. Ho¹、D. S. Ang¹、C. M. Ng² (1.Nanyang Tech. Univ.、2.GLOBALFOUNDRIES Singapore Pte. Ltd. , Singapore)

https://doi.org/10.7567/SSDM.2010.C-8-2