Failure and Recovery of Double-Layer CBRAM Studied by <i>In-Situ</i> TEM

M. Arita

doi:https://doi.org/10.7567/SSDM.2019.PS-2-16

13:00 〜 15:00

[PS-2-16] Failure and Recovery of Double-Layer CBRAM Studied by In-Situ TEM

^○M. Arita¹, R. Ishikawa¹, K. Arima¹, A. Tsurumaki-Fukuchi¹, Y. Takahashi¹, M. Kudo², S. Matsumura² (1.Hokkaido Univ. (Japan), 2.Kyushu Univ. (Japan))

https://doi.org/10.7567/SSDM.2019.PS-2-16

2019 International Conference on Solid State Devices and Materials

[PS-2-16] Failure and Recovery of Double-Layer CBRAM Studied by In-Situ TEM