Study of Leakage Mechanisms in III-V Nano-ridge diode on Silicon

Olga - Syshchyk

doi:https://doi.org/10.7567/SSDM.2020.D-5-04

14:45 〜 15:00

[D-5-04] Study of Leakage Mechanisms in III-V Nano-ridge diode on Silicon

〇Olga - Syshchyk^1,2, Vasyl - Motsnyi², Renaud Puybaret², Jiwon Lee², Gauri Karve², Bob Puers¹, Chris Van Hoof^1,2 (1. KU Leuven, Belgium(Belgium), 2. Interuniversity Microelectronics Center (IMEC)(Belgium))

https://doi.org/10.7567/SSDM.2020.D-5-04

2020 International Conference on Solid State Devices and Materials

[D-5-04] Study of Leakage Mechanisms in III-V Nano-ridge diode on Silicon