16:22 〜 16:29

[B-6-03] Evaluation of 2D Ferroelectric-FET NVMs considering Memory Window and Reliability related Interlayer Field

〇You Sheng Liu¹、Pin Su¹ (1.National Yang Ming Chiao Tung University)

https://doi.org/10.7567/SSDM.2021.B-6-03