16:29 〜 16:36
[D-2-04] Effect of k-means Clustering for Analysis of Power Cycle Test Waveforms on Failure Prediction
〇Ryosuke Okachi1、Katsuhiro Kutsuki1、Junya Muramatsu1、Masataka Deguchi2
(1.Toyota Central R&D Labs., Inc.、2.DENSO Corp.)
https://doi.org/10.7567/SSDM.2021.D-2-04