Abnormal Negative Shift under Positive Bias Illumination Stress in Amorphous In-Ga-Zn-O Thin-Film Transistors

Pengfei - Wang, Yunfei Liu, Yunping Wang, Rongsheng Chen, Zhihe Xia, Sunbin Deng, Man Wong, Hoi Sing Kwok, Shengdong Zhang, Lei Lu

doi:https://doi.org/10.7567/SSDM.2021.J-2-05

4:36 PM - 4:43 PM

[J-2-05] Abnormal Negative Shift under Positive Bias Illumination Stress in Amorphous In-Ga-Zn-O Thin-Film Transistors

〇Pengfei - Wang¹, Yunfei Liu¹, Yunping Wang¹, Rongsheng Chen², Zhihe Xia³, Sunbin Deng³, Man Wong³, Hoi Sing Kwok³, Shengdong Zhang¹, Lei Lu¹ (1.School of Electronic and Computer Engineering, Peking Univ., Shenzhen, 2.School of Electronic and Information Engineering, South China Univ. of Techn., Guangzhou, 3.State Key Laboratory of Advanced Displays and Optoelectronics Technologies, The Hong Kong Univ. of Sci. and Tech.)

https://doi.org/10.7567/SSDM.2021.J-2-05

2021 International Conference on Solid State Devices and Materials

[J-2-05] Abnormal Negative Shift under Positive Bias Illumination Stress in Amorphous In-Ga-Zn-O Thin-Film Transistors