The Japan Society of Applied Physics

[P-3-3] Investigation of Temperature Dependence on DC and Low-Frequency Noise Characteristics in Uniaxial Tensile Strained nMOSFETs

S. C. Tsai1、S. L. Wu2、J. F. Chen1、S. J. Chang1、C. Y. Chang1、P. C. Huang1、C. Y. Wu2、M. S. Chen3、Y. C. Cheng3、O. Cheng3 (1.National Cheng Kung Univ.、2.Cheng Shiu Univ.、3.United Microelectronics Corp. , Taiwan)

https://doi.org/10.7567/SSDM.2011.P-3-3