The Japan Society of Applied Physics

11:45 〜 12:00

[G-6-03] Transient Thermal Analysis of Si-based Solar Cell Using Electrical Junction-Temperature Measurement and Impedance Spectroscopy

Y. H. Chin1, S. J. Wang1, C. H. Hung1,Y. C. Huang1, C. H. Wu2, N. S. Wu1, H. P. Yan1 (1.National Cheng Kung Univ.(Taiwan), 2.Chung Hua Univ.(Taiwan))

https://doi.org/10.7567/SSDM.2016.G-6-03