[3O01-07] Inspection and Maintenance Technology

[3O02] Development of Non-destructive Testing for Embedded Hardware

(1) Mockup tests

Susumu Miura¹, Shouji Sekiguchi¹, Kouzou Hattori¹, Ryota Ogawa², Hiroaki Fujiyoshi², *Yoshihiro Isobe² (1. Japan Nuclear Fuel LIMITD, 2. Nuclear Fuel Industries, Ltd.)

Keywords:embedded hardware, hammering inspection, AE sensor, signal analysis

Non-destructive evaluation technique was developed for embedded hardware using hammering inspection with AE (Acoustic Emission) sensor. The integrity of the embedded hardware is judged from both the vibration duration of the embedded hardware recorded by the AE sensor and the frequency analysis of the vibration signal. Mockup tests were carried out in order to verify the effectiveness of the technique and to obtain the diagnostic criteria.