Sessions

Technical division and Network » Division of Radiation Technology

Planning Lecture

[2F_PL] Current status and future trends in electron microscopy

Thu. Mar 21, 2019 1:00 PM - 2:30 PM Room F (Common Education Bildg. 2 2F No.23)

Chair:Hiroyuki Takahashi(Univ. of Tokyo)

+Add all to schedule

[2F_PL01] Direct electromagnetic field imaging in materials by advanced atomic-resolution electron microscopy

*Naoya Shibata¹ (1. Univ. of Tokyo)

[2F_PL02] Material characterization using scanning transmission electron microscopy and electron energy-loss spectroscopy

*Koji Kimoto ¹ (1. NIMS)

[2F_PL03] Material Analyses by Electron Holography

*Toshiaki Tanigaki¹ (1. Hitachi)

×

Authentication

Abstract password authentication.
Password is required to view the abstract. Please enter a password to authenticate.

×

Please log in with your participant account.
» Participant Log In