[2K05-08] Accelerator & Beam Application 1

[2K06] Status of RF-gun-based high-voltage pulsed electron microscope

*Jinfeng Yang¹, Koichi Kan¹, Masao Gohdo¹, Yoichi Yoshida¹ (1. ISIR, Osaka Univ.)

Keywords:Ultrafast electron microscope, Femtosecond electron pulse, RF gun, High-voltage electron microscope

Femtosecond atomic-scale imaging is a most challenging subject in materials science and has long been a cherished dream tool for scientists wishing to study ultrafast structural dynamics. In this research, an innovative relativistic ultrafast electron microscope (UEM) has being developed by combining a radio-frequency (RF) acceleration-based electron gun technology into high-voltage electron microscope. In this meeting, we will report the status of UEM development. Some demonstrations will are presented.