10:30 〜 10:45
[1B05] A stable free-surface-detection method for consistent high-order MPS method
キーワード： Particle method, MPS, Free surface , Stability, Accuracy
The high-order schemes in MPS method can enhance accuracy but easily suffer from numerical instability at free surfaces. In this study, a new free-surface-detection method based on the stability analysis is proposed to solve this problem. Numerical examples demonstrated that the new method detected fewer free-surface particles but enhanced the stability.