Special Session

[MonPM2D] (Special Session) Measurement techniques underpinning EMC reliability

Mon. May 20, 2024 4:40 PM - 6:00 PM Room D (B5+B6+B7)

Chairs: Katsumi Fujii (National Institute of Information and Communications Technology), Takehiro Morioka (National Institute of Advanced Industrial Science and Technology)

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[MonPM2D.1] Accelerated EMC Site Validation Testing From 30 MHz to 200 MHz With a Reduced Number of Measurement Heights Using the Matrix Pencil Method

^○Zhong Chen(ETS-Lindgren), Yibo Wang(ETS Lindgren)

[MonPM2D.2] Reference Measurement for Inter-Laboratory Comparison of Electric Field Uniformity for Radiated Immunity Testing

^○Sayaka Matsukawa(National Institute of Advanced Industrial Science and Technology), Nao Takahashi(National Institute of Advanced Industrial Science and Technology), Yuji Ano(Yamaguchi Prefectural Industrial Technology Institute), Masakatsu Fujimoto(Yamaguchi Prefectural Industrial Technology Institute), Michitaka Ameya(NMIJ/AIST)

[MonPM2D.3] Round-Robin Test of Site VSWR Validation for 18-40 GHz Band in Japan

^○Jerdvisanop Chakarothai(National Institute of Information and Communications Technology), Katsumi Fujii(National Institute of Information and Communications Technology), Noriyuki Mitsuzuka(Telecom Engineering Center), Toshiki Shimasaki(VCCI), Hidenori Muramatsu(VCCI Council), Shinichi Okuyama(NEC Platforms, Ltd.), Masaru Yoshihara(Riken Environmental System Co., Ltd.), Hironari Tanaka(Ohtama Calibration Service Co., Ltd.), Katsunori Miura(Japan Quality Assurance Organization), Takeshi Yamanaka(Intertek Japan), Masashi Takabe(NTT Advanced Technology Corporation), Kimihiro Tajima(NTT Advanced Technology Corporation)

[MonPM2D.4] Calibration of an Optical E-Field Transfer Probe

^○Takehiro Morioka(National Institute of Advanced Industrial Science and Technology)