^○Yudi Fan(Zhejiang University), Da Li(Zhejiang University), Hanzhi Ma(Zhejiang University), Er-Ping Li(Zhejiang University)

^○Shang-Yin Li(YUAN ZE University), Cheng-Nan Chiu(Yuan Ze University), Chiu-Kuo Chen(Bureau of Standards, Metrology and Inspection), Ye-Hong Chen(Bureau of Standards, Metrology and Inspection)

^○Sho Muroga(Tohoku University), Akira Ito(Panasonic Industry Co. Ltd.), Motoi Kawamura(Panasonic Industry Co. Ltd.), Tomonaga Ueno(Nagoya University), Kishio Hidaka(Yamagata University), Motoshi Tanaka(Akita University), Osamu Kawasaki(Japan Aerospace Exploration Agency), Yasushi Endo(Tohoku University)

^○Ryuki Hirose(University of Hyogo), Shinichiro Yamamoto(University of Hyogo), Morimichi Itoh(Osaka Research Institute of Industrial Science and Technology), Shinnosuke Kagekawa(Osaka Research Institute of Industrial Science and Technology), Hiroshi Igarashi(Keeper Corporation Co. Ltd.)

^○Shinnosuke Kagekawa(Osaka Research Institute of Industrial Science and Technology), Morimichi Itoh(Osaka Research Institute of Industrial Science and Technology), Shinichiro Yamamoto(University of Hyogo), Hiroshi Igarashi(Keeper Corporation Co. Ltd.)