^○Takumi Kawashima(Kyushu Institute of Technology), Kazuya Wakita(DENSO Corporation), Yoshifumi Kaku(DENSO Corporation), Tohlu Matsushima(Kyushu Institute of Technology), Yuki Fukumoto(Kyushu Institute of Technology)

^○Masahiro Yoshida(Nagoya Institute of Technology), Yusuke Yano(Nagoya Institute of Technology), Jianqing Wang(Nagoya Institute of Technology)

^○Hayato Komiya(Graduate School of Informatics and Engineering, the University of Electro-Communications), Yoshiki Kayano(The University of Electro-Communications), Yoshio Kami(University of Electro-Communications), Fengchao Xiao(The University of Electro-Communications), Hiroya Ueyama(Murata Manufacturing Co., Ltd.), Naoki Iida(Murata Manufacturing Co. Ltd.)

^○Wei-Hsiu Tsai(National Taiwan University of Science and Technology), Ding-Bing Lin(National Taiwan University of Science and Technology), Tzu-Fang Tseng(Bizlink Internation Corporation), Chang-Hsun Ho(National Taiwan University of Scicnce and Technology)

^○Yu Ching Wang(YUAN ZE University), Cheng-Nan Chiu(Yuan Ze University), Ming-Kun Hsieh(Bureau of Standards, Metrology and Inspection (BSMI)), Liang-Yang Lin(Bureau of Standards, Metrology & Inspection), Yuan-Fu Ku(Taiwan Testing and Certification Center)

^○Ruifeng Xu(Zhejiang University), Da Li(Zhejiang University), Er-Ping Li(Zhejiang University)