2024年5月22日(水) 16:40 〜 18:00 Room E (Exhibition Hall)

Organizer:David Pommerenke

The workshop introduces near field scanning techniques for both immunity and emissions and critically analyzes their abilities and limitations. The following techniques will be discussed:
Near Field Scanning:
• Settings such as probes, time needed, resolution, sensitivity, scanning strategies
• Data processing of near field data such as A vs. B, synchronized scanning, near to far field transformation
Emission Source Microscopy (ESM), this is a method similar to near field scanning, but it ONLY shows the radiating sources and suppresses the none radiating near field:
• Mathematical base of ESM
• Phase measurement in scanning
• Ability and Limit of ESM
• Processing such as masking, radiation pattern
• Related holographic methods
RF susceptibility scanning, here a local probe injects an RF signal locally and the system response is observed. This is useful for finding the root cause of RF Immunity failures.
• Implementation
• Ability and Limits
ESD susceptibility scanning, here, locally pulsed signals having < 500ps risetime are injected mostly via field coupling and the system response is observed. This is for the root cause analysis of ESD induced soft failures in electronic system.
• Implementation
• Ability and Limits
Finally, the workshop will discuss aspects in which scanning can and should be improved.