[WedAM1C.4] Dual Inductive Probe Concept for Impedance Measurements From 9 kHz to 120 MHz in Presence of High DC-Bias Current - Part Two
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Presentation information
Regular Session
[WedAM1C] (Regular Session) EMC Measurements (1)
Wed. May 22, 2024 8:50 AM - 10:30 AM Room C (B3+B4)
Chairs: Jerdvisanop Chakarothai (National Institute of Information and Communications Technology (NICT)), Masanori Ishii (National Institute of Advanced Industrial Science and Technology (AIST))