Structure analyses bu Synchrotron Small Angle X-ray Scattering Technique

○TAKENAKA

Presentation information

Special Sessions (organized by CSJ members)

Fundamentals and Applications of Synchrotron-based SAXS Measurement

Sun. Mar 22, 2020 9:30 AM - 12:30 PM S5 (K702, Lecture Hall Bldg. [7F])

1S5-02～1S5-03 TAKAYA, Hikaru
1S5-04～1S5-07 HONMA, Tetsuo

9:35 AM - 10:05 AM

[1S5-02] Structure analyses bu Synchrotron Small Angle X-ray Scattering Technique

Special Program Lecture

○TAKENAKA, Mikihito (ICR, Kyoto Univ.)

Keywords:Small Angle X-ray Scattering, Hierarchical Structures, In-situ Measurement

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