Improvement of the image analysis methods in the surface elemental analysis based on the scanning probe microscopy: XANAM

○SUZUKI

Presentation information

Academic Program (AP)

Analytical Chemistry

Tue. Mar 20, 2018 1:40 PM - 4:40 PM G3 (1113, Bldg. 11)

1G3-29～1G3-33　HASEGAWA, Takeshi
1G3-35～1G3-40　KUNIMURA, Shinsuke
1G3-42～1G3-46　HASHIMOTO, Takeshi

2:40 PM - 2:50 PM

[1G3-35] Improvement of the image analysis methods in the surface elemental analysis based on the scanning probe microscopy: XANAM

01.Oral A

○SUZUKI, Shushi; MUKAI, Shingo; CHUN, Wang-jae; NOMURA, Masaharu; ASAKURA, Kiyotaka (Grad. Sch. Eng., Nagoya Univ.; Inst. for Cat., Hokkaido Univ.; Coll. of Liberal Arts, ICU; KEK)

PC Setting Time : 14:30 - 14:40

Keywords:Surface elemental analysis、High spatial resolution、Non-destructive analysis、Noncontact atomic force microscopy、Synchrotron Radiation X-ray