Session information

Special Sessions (organized by CSJ members)

Special Sessions (organized by CSJ members)

XAFS Analysis for Chemists - Fundamental Guidance and the Cutting-Edge Applications

Sat. Mar 16, 2019 9:30 AM - 12:30 PM S1 (133, Bldg. 1 [3F])

1S1-01～1S1-02　TAKAYA, Hikaru
1S1-03～1S1-05　HONMA, Tetsuo
1S1-06　TAKAYA, Hikaru

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9:30 AM - 10:10 AM

[1S1-01] Fundamentals for XAFS analysis

Special Program Lecture

○ASAKURA, Kiyotaka (Inst. for Cat., Hokkaido Univ.)

10:10 AM - 10:40 AM

[1S1-02] Application of XANES spectroscopy: Oxidation number and pre-edge peak

Special Program Lecture

○YAMAMOTO, Takashi (Grad. Sch. Tech. Ind. Soc. Sci., Tokushima Univ.)

10:40 AM - 11:10 AM

[1S1-03] Basics and applications of theoretical simulations of XANES

Special Program Lecture

○HATADA, Keisuke (Fac. Sci., Univ. of Toyama)

11:10 AM - 11:40 AM

[1S1-04] Materials science driven by a fusion of XAFS measurements and informatics

Special Program Lecture

○MIZUMAKI, Masaichiro (JASRI)

11:40 AM - 12:00 PM

[1S1-05] Industrial use: Observation inside battery by XAFS

Special Program Lecture

○ITOH, Takanori (NISSAN ARC, LTD.)

12:00 PM - 12:30 PM

[1S1-06] XAFS in soft X-ray regions: What is observed and understood by this spectroscopic method

Special Program Lecture

○NAGASAKA, Masanari (PMS, IMS)