19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

セッション情報

We-2: MI & Characterization

Materials informatics & Characterization

We-2: MI & Characterization

2022年8月31日(水) 16:45 〜 18:30 DRIP ONLINE CONFERENCE

Chair:Jean-Pierre Landesman、Takayoshi Shimura

△:Presentation by Applicant for the DRIP "Young Researcher Award"

17:15 〜 17:30

*Yutaka Ohno1, Hideto Yoshida2, Tatsuya Yokoi3, Kenta Yamakoshi3, Takuto Kojima4, Kentaro Kutsukake5, Hiroyuki Tanaka3, Xin Liu3, Katsuyuki Matsunaga3, Hiroaki Kudo4, Koji Inoue1, Yasuyoshi Nagai1, Noritaka Usami3 (1. IMR, Tohoku University, 2. SANKEN, Osaka Univ., 3. GSE, Nagoya Univ., 4. GSI, Nagoya Univ., 5. AIP, RIKEN)

18:00 〜 18:15

*Merve Pinar Kabukcuoglu1,2, Andreas Danilewsky2, Elias Hamann1, Simon Bode1,3, Simon Haaga1,2, Tilo Baumbach1,3, Daniel Hänschke1 (1. Institute for Photon Science and Synchrotron Radiation (IPS) Karlsruhe Institute of Technology (KIT), 2. Crystallography, University of Freiburg, 3. Laboratory for Applications of Synchrotron Radiation (LAS), Karlsruhe Institute of Technology (KIT))

18:15 〜 18:30

*Emiliano Bonera1, Eleonora Bonaventura1,2, Riccardo Loss1,2, Daya Dhungana2, Carlo Grazianetti2, Christian Martella2, Alessandro Molle2 (1. Dipartimento di Scienza dei Materiali, Università degli Studi di Milano-Bicocca, via Cozzi 55, 20125 Milano, Italy , 2. CNR-IMM Unit of Agrate Brianza, via C. Olivetti 2, Agrate Brianza, Italy)