19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

印刷

Tu-P: Poster-1

General

Tu-P: Poster-1


✳︎Participants can view e-posters and short presentation videos anytime during Aug. 29 - Sep. 8 on the DRIP XIX website.

2022年8月30日(火) 18:45 〜 20:00 DRIP-Poster-ZOOM

△ [TuP-01] Inelastic X-ray scattering measurement on single crystalline GeSn thin film

*Masato Chino1, Ryo Yokogawa2,3, Atsushi Ogura2,3, Hiroshi Uchiyama4, Hirokazu Tatsuoka1, Yosuke Shimura1,5 (1. Shizuoka Univ., 2. MREL, 3. Meiji Univ., 4. JASRI, 5. Res. Inst. Electron. Shizuoka Univ.)