19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

印刷

Tu-P: Poster-1

General

Tu-P: Poster-1


✳︎Participants can view e-posters and short presentation videos anytime during Aug. 29 - Sep. 8 on the DRIP XIX website.

2022年8月30日(火) 18:45 〜 20:00 DRIP-Poster-ZOOM

[TuP-09] Point defects in ion implanted GaN and their role of dopant activation studied by positron annihilation spectroscopy

*Akira Uedono1, Shoji Ishibashi2 (1. Univ. of Tsukuba, 2. AIST)