19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

印刷

Tu-P: Poster-1

General

Tu-P: Poster-1


✳︎Participants can view e-posters and short presentation videos anytime during Aug. 29 - Sep. 8 on the DRIP XIX website.

2022年8月30日(火) 18:45 〜 20:00 DRIP-Poster-ZOOM

[TuP-10] The Relation between Defects and Reliability of High-Power InGaN Laser Diodes

*Xinlu Chen1, Haonan Chen1, Zhibai Zhong1, Wenyu Kang1, Wei Lin1, Junyong Kang1 (1. Xiamen University)