19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

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Tu-P: Poster-1

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Tu-P: Poster-1


✳︎Participants can view e-posters and short presentation videos anytime during Aug. 29 - Sep. 8 on the DRIP XIX website.

Tue. Aug 30, 2022 6:45 PM - 8:00 PM DRIP-Poster-ZOOM

△ [TuP-14] Designing automated defect detection algorithm for characterization of semiconductor wafers

*Shunta Harada1, Kota Tsujimori1 (1. Nagoya University)