19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

Tu-P: Poster-1

General

Tu-P: Poster-1


✳︎Participants can view e-posters and short presentation videos anytime during Aug. 29 - Sep. 8 on the DRIP XIX website.

2022年8月30日(火) 18:45 〜 20:00 DRIP-Poster-ZOOM

[TuP-20] Investigation of comet-shaped defects in epi-InP layer grown on S-doped and Fe-doped InP substrates

*Lijie Liu1, Youwen Zhao1 (1. Institute of Semiconductors , Chinese Academy of Sciences)