We-1: Oxide

[We1-1/Inv] Structural defects in beta-Ga₂O₃ analyzed by X-ray topography and complementary techniques

*Yongzhao Yao¹, Yoshihiro Sugawara¹, Koji Sato¹, Daisaku Yokoe¹, Hironobu Miyamoto², Daiki Wakimoto², Kohei Sasaki², Akito Kuramata², Yukari Ishikawa¹ (1. Japan Fine Ceramics Center, 2. Novel Crystal Technology, Inc.)