19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

印刷

We-2: MI & Characterization

Materials informatics & Characterization

We-2: MI & Characterization

2022年8月31日(水) 16:45 〜 18:30 DRIP ONLINE CONFERENCE

Chair:Jean-Pierre Landesman、Takayoshi Shimura

16:45 〜 17:15

[We2-1/Inv] Materials Informatics for the semiconductor crystal growth

*Kentaro Kutsukake1,2 (1. RIKEN, 2. Nagoya Univ.)