19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

We-2: MI & Characterization

Materials informatics & Characterization

We-2: MI & Characterization

2022年8月31日(水) 16:45 〜 18:30 DRIP ONLINE CONFERENCE

Chair:Jean-Pierre Landesman、Takayoshi Shimura

17:15 〜 17:30

[We2-2] Multiscale analysis of dislocation generation at Σ3 grain boundaries during cast growth of high-performance multicrystalline Si ingots

*Yutaka Ohno1, Hideto Yoshida2, Tatsuya Yokoi3, Kenta Yamakoshi3, Takuto Kojima4, Kentaro Kutsukake5, Hiroyuki Tanaka3, Xin Liu3, Katsuyuki Matsunaga3, Hiroaki Kudo4, Koji Inoue1, Yasuyoshi Nagai1, Noritaka Usami3 (1. IMR, Tohoku University, 2. SANKEN, Osaka Univ., 3. GSE, Nagoya Univ., 4. GSI, Nagoya Univ., 5. AIP, RIKEN)