19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

We-2: MI & Characterization

Materials informatics & Characterization

We-2: MI & Characterization

2022年8月31日(水) 16:45 〜 18:30 DRIP ONLINE CONFERENCE

Chair:Jean-Pierre Landesman、Takayoshi Shimura

17:30 〜 17:45

[We2-3] Interpretation of dislocation images in synchrotron X-ray topography using ray-tracing simulations

*Hongyu Peng1, Balaji Raghothamachar1, Michael Dudley1 (1. Stony Brook University)