19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

We-2: MI & Characterization

Materials informatics & Characterization

We-2: MI & Characterization

2022年8月31日(水) 16:45 〜 18:30 DRIP ONLINE CONFERENCE

Chair:Jean-Pierre Landesman、Takayoshi Shimura

17:45 〜 18:00

[We2-4] Identifying edge-component Burgers vector of threading dislocations in SiC crystals by birefringence imaging

*Shunta Harada1, Kenta Murayama2 (1. Nagoya University, 2. Mipox Corporation)