19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

We-2: MI & Characterization

Materials informatics & Characterization

We-2: MI & Characterization

2022年8月31日(水) 16:45 〜 18:30 DRIP ONLINE CONFERENCE

Chair:Jean-Pierre Landesman、Takayoshi Shimura

18:15 〜 18:30

[We2-6] Optothermal Raman Spectroscopy of 2D materials on metal substrates.

*Emiliano Bonera1, Eleonora Bonaventura1,2, Riccardo Loss1,2, Daya Dhungana2, Carlo Grazianetti2, Christian Martella2, Alessandro Molle2 (1. Dipartimento di Scienza dei Materiali, Università degli Studi di Milano-Bicocca, via Cozzi 55, 20125 Milano, Italy , 2. CNR-IMM Unit of Agrate Brianza, via C. Olivetti 2, Agrate Brianza, Italy)