19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

印刷

We-P: Poster-2

General

We-P: Poster-2


✳︎Participants can view e-posters and short presentation videos anytime during Aug. 29 - Sep. 8 on the DRIP XIX website.

2022年8月31日(水) 18:45 〜 20:00 DRIP-Poster-ZOOM

[WeP-04] An Enhanced Trench-Filling Epitaxy of Ge on Si for Free-Space Photodetector Application

*Kota Kato1, Kazuki Motomura1, Jose A. Piedra-Lorenzana1, MOHD FAIZ BIN AMIN1, Takeshi Hizawa1, Tetsuya Nakai2, Yasuhiko Ishikawa1 (1. Toyohashi Univ. Tech., 2. SUMCO Corp.)