19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

We-P: Poster-2

General

We-P: Poster-2


✳︎Participants can view e-posters and short presentation videos anytime during Aug. 29 - Sep. 8 on the DRIP XIX website.

2022年8月31日(水) 18:45 〜 20:00 DRIP-Poster-ZOOM

[WeP-20] Analysis of InP/InGaAs p-i-n Photodiode Failed by Electrostatic Discharge

*Yuta Ito1, Ryo Yokogawa1,2, Naomi Sawamoto1,2, Osamu Ueda2, Atsushi Ogura1,2 (1. Meiji University, 2. Meiji Renewable Energy Laboratory)