19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

We-P: Poster-2

General

We-P: Poster-2


✳︎Participants can view e-posters and short presentation videos anytime during Aug. 29 - Sep. 8 on the DRIP XIX website.

2022年8月31日(水) 18:45 〜 20:00 DRIP-Poster-ZOOM

[WeP-21] Reduction of crystal defects in GaP buffer layers grown on Si(100) by MOCVD

*Manali Nandy1, Agnieszka Paszuk2, Markus Feifel3, Christian Koppka4, Peter Kleinschmidt5, Frank Dimroth6, Thomas Hannappel7 (1. Technische Universität Ilmenau (TU Ilmenau), 2. Technische Universität Ilmenau (TU Ilmenau), 3. Fraunhofer Institute for Solar Energy Systems ISE, 4. Technische Universität Ilmenau (TU Ilmenau), 5. Technische Universität Ilmenau (TU Ilmenau), 6. Fraunhofer Institute for Solar Energy Systems ISE, 7. Technische Universität Ilmenau (TU Ilmenau))