Poster Session

[P-69] Electronics and Radiation Survivability and Materials Testing for Space Applications

*Joshua Gogolski^1,4,2,3 (1. Pajarito Scientific Corporation (United States of America), 2. Texas A&M University (United States of America), 3. Colorado School of Mines (United States of America), 4. American Nuclear Society (United States of America))

キーワード：Electronic survivability, criticality, accident, CAAS, space