Atomic Plane Strain Associated van der waals Interface Quality of Bi<sub>2</sub>Te<sub>3</sub>/FeTe Thin Film growth by Molecular Beam Epitaxy

Wenyu Hu

1:00 PM - 2:30 PM

[TH-PS-42] Atomic Plane Strain Associated van der waals Interface Quality of Bi₂Te₃/FeTe Thin Film growth by Molecular Beam Epitaxy

〇Wenyu Hu¹, Xinru Han¹, Jie Jiang¹, Yang Qiu¹, Gan Wang¹ (1. Southern Uni. of Sci. and Tech. (China))

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Presentation information

Heterostructures and Nanostructures

[TH-PS-42] Atomic Plane Strain Associated van der waals Interface Quality of Bi₂Te₃/FeTe Thin Film growth by Molecular Beam Epitaxy

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Presentation information

Heterostructures and Nanostructures

[TH-PS-42] Atomic Plane Strain Associated van der waals Interface Quality of Bi2Te3/FeTe Thin Film growth by Molecular Beam Epitaxy

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[TH-PS-42] Atomic Plane Strain Associated van der waals Interface Quality of Bi₂Te₃/FeTe Thin Film growth by Molecular Beam Epitaxy